In addition to superior resolution, many of the Dimension Icon AFM’s new features are designed specifically to increase usability and productivity for both new and expert AFM researchers: This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the noise performance of most open-loop, high-resolution AFMs. Incorporating the latest evolution of Bruker’s industry-leading tip-scanning AFM technology, the Dimension Icon AFM’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. AFM Performance and Productivity Redefined The Icon has been designed from top to bottom to deliver revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours, enabling increased productivity. Building upon the world's most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility. The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry.
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